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Comparative Analysis of Superimposed AC Voltage (Ripple Voltage) Test Differences

ISO 16750-2:2023, GB/T 28046.2-2019(ISO 16750-2:2012)

VW 80000:2021, MBN LV124-1 2013

GB/T 45120-2024(ISO 21780:2020), MBN LV148 2013

1. Standard Information

Standard Name Issuing Body/Scope of Application Core Application Scenario Publication Year
ISO 16750-2:2023 ISO International Organization for Standardization (General Road Vehicles) 12V/24V System 2023
GB/T 28046.2-2019 China (Adopts ISO 16750-2:2012) 12V/24V System 2019
VW 80000:2021 Volkswagen Group (Motor Vehicles ≤ 3.5 tons) 12V System/24V System 2021
MBN LV124-1 2013 Mercedes-Benz (Motor Vehicles ≤ 3.5 tons) 12V System/24V System 2013
MBN LV148 2013 Mercedes-Benz (48V Mild Hybrid System) 48V Electrical System 2013
GB/T 45120-2024 China (Adopts ISO 21780:2020) 48V Electrical System 2024

2. Test Parameters

Superimposed AC Voltage Test Difference Comparison 1: Sweep Method

Standard Number GB/T 28046.2-2019 VW 80000:2021 MBN LV124-1 2013 MBN LV148 2013
Test Item 4.4 Superimposed AC Voltage 5.4.8 E-06 Ripple voltage 6.6 E-06 Superimposed alternating voltage 3.6 E48-05 Superimposed AC voltage
Operating Mode Not explicitly specified

Drivingmax

Maximum Load Mode

Operating mode II.c

Maximum Load Mode

Operating mode II.c

Maximum Load Mode

Test Voltage

12V System: USmax=16V

24V System: USmax=32V

Vopmax=16V/9.8V/9V/6V UBmax=16V

V48min,unlimited=36V

V48max,unlimited=52V

Frequency Range 50Hz~25kHz

case1~3:15Hz~30kHz

case4:30kHz~200kHz

15Hz~30kHz

case1:15Hz~30kHz

case2:30kHz~200kHz

Sweep Method Triangular, Logarithmic Triangular, Logarithmic Triangular, Logarithmic Triangular, Logarithmic
Cycle Count 5 15 15 15
DUT Quantity Not explicitly specified ≥6 ≥6 6

Test Case

(Low Frequency)

Frequency Range 50Hz~25kHz 15Hz~30kHz 15Hz~30kHz 15Hz~30kHz
Vpp

12V System: 1Vpp/4Vpp/2Vpp

24V System: 1Vpp/4Vpp/10Vpp

case1:2Vpp
case2:3Vpp
case3:6Vpp
case1:2Vpp
case2:3Vpp
case3:6Vpp

6Vpp

Sweep Time 2min 2min 2min 2min

Test Case

(High Frequency)

Frequency Range / 30kHz~200kHz / 30kHz~200kHz
Vpp / 1Vpp /

2Vpp

Sweep Time / 10min / 2min
Other /

Ri≤100mΩ

Ri≤100mΩ Ri=60mΩ

 

Superimposed AC Voltage Test Difference Comparison 2: Step Injection

Standard Number ISO 16750-2:2023 GB/T 45120-2024(ISO 21780:2020)

Test Item

4.4 Superimposed alternating voltage Test-09: Voltage Ripple
U0

U0= USmax - Upp/2

U0= USmin + Upp/2

31V≤U0≤54V
Test Combination /

f1:U0=35V and 50V

f2:U0=34V and 51V

f3:U0=32V and 53V

Frequency Range

f1: 10Hz-30kHz

f2: 30kHz-200kHz

f1:10Hz-1kHz

f2:1kHz-30kHz

f3:30kHz-200kHz

Frequency Step Logarithmic Step 2% Logarithmic Step 2%
Limit Upp/Ipp

f1: Severity level 1,

                  6V±0.2V/15A(12V System)

                  10V±0.2V/15A(24V System)

f1: Severity level 2,3V ± 0.2V/15A

f1: Severity level 3,2V ± 0.1V/15A

f2: Severity level 4,1V ± 0.1V/10A

f1:8V±0.16V/80A

f2:6V±0.12V/15A

f3:2V±0.04V/10A

Cycle Count 1 test sequence per test combination

Once per test combination

Reference Test
Operating Mode 3.3 (Minimum Load Operating Mode) 2.3 (Minimum Load Operating Mode)
Test Method

1. The power supply superimposes AC voltage ripple UR on U0, UR gradually increases until reaching the DUT's maximum voltage ripple Upp or maximum current limit Ipp

2. Record the power supply voltage ripple UR determined for each frequency step

1. The power supply superimposes AC voltage ripple UR on U0, UR gradually increases until reaching the DUT's maximum voltage ripple Upp or maximum current limit Ipp

2. Record the power supply voltage ripple UR determined for each frequency step

Voltage Ripple Test (Injection Test)
Operating Mode 3.2 (Typical Operating Mode) 2.2 (Typical Operating Mode)
Injection Method Step mode, frequency step is logarithmic 2% step Step mode, frequency step is logarithmic 2% step
Test Time Dwell time ≥2s Dwell time ≥2s
Impedance Test Measure DUT impedance before and after test Measure DUT impedance before and after test
Test Method

1. Apply the voltage ripple UR corresponding to each frequency step determined in the reference test to the DUT, dwell time ≥2s per frequency point

2. Even if the current limit Ipp is exceeded, the voltage ripple UR should not be reduced

1. Apply the voltage ripple UR corresponding to each frequency step determined in the reference test to the DUT, dwell time ≥2s per frequency point

2. Even if the current limit Ipp is exceeded, the voltage ripple UR should not be reduced

Requirement

Functional Status A

DUT impedance deviation before and after test should not exceed agreed tolerance

FC Category I components comply with FS1 functional status requirements

FC Category II, IV components comply with FS2 functional status requirements

FC Category III components comply with FS3 functional status requirements

DUT impedance deviation before and after test should not exceed defined standard tolerance

3. Key Points

1. Frequency Coverage Range

ISO 16750-2:2023, GB/T 45120-2024(ISO 21780:2020), and LV148 extend the test frequency to 200kHz, covering the scenario of high-frequency ripple (typically between 50kHz~200kHz) generated by DC/DC converters in new energy vehicles, ensuring the reliability of electronic equipment in the new energy vehicle environment; The ripple frequency of alternators is typically 100Hz~10kHz, fluctuating slightly due to engine speed changes. LV124 and VW80000 (case1-3) are limited to below 30kHz, mainly targeting traditional fuel vehicle alternator ripple.

2. Limit Division

Adopts segmented limits. The low-frequency band (10Hz-30kHz) mainly simulates low-frequency ripple from traditional generators or DC/DC converters; The high-frequency band (30kHz~200kHz) mainly simulates high-frequency switching ripple from new energy vehicle equipment like DC/DC converters and OBC (On-Board Charger). The limits are stricter, reduced to 1Vpp/2Vpp, to avoid interference with high-frequency communication equipment (high-frequency ripple can easily conduct through power lines to communication equipment, such as CAN bus signal frequencies of 500kHz~1MHz, causing bit errors or interruptions).

3. Enhanced Test Rigor

ISO 16750-2:2023, GB/T 45120-2024(ISO 21780:2020) add reference testing (pre-scan UR value) to ensure the actual voltage at the DUT terminal meets the standard, avoiding the impact of power supply internal resistance.

4. Reference Test

1. Purpose

The design of the "Reference Test (Pre-scan UR value)" aims to determine the accurate power supply terminal voltage setting value through pre-testing, addressing the issue of "DUT terminal voltage attenuation" caused by factors such as equivalent internal resistance (power supply internal resistance, wiring harness impedance, device under test input impedance) in actual testing, ensuring the actual ripple voltage (Upp) at the DUT terminal complies with standard requirements.

2. Why Add Reference Test

With the popularization of new energy vehicles, the switching frequency (increased from traditional tens of kHz to hundreds of kHz or even higher) and ripple noise (generated by high-frequency switching of power devices) of vehicle power supply systems (such as DC/DC converters, battery management systems) have increased significantly. The traditional "open-loop injection" test (such as ISO 16750-2:2012 edition) cannot monitor the DUT terminal voltage in real time, easily leading to the problem of "power supply terminal voltage meeting standard but DUT terminal voltage insufficient" due to factors like equivalent internal resistance, failing to accurately assess equipment performance under actual operating conditions.

To address this issue, the "Superimposed AC Voltage Test" has been upgraded from "open-loop" to "closed-loop," requiring a reference test (pre-scan UR value) first, which can more accurately calibrate the Vpp injected into the DUT terminal.

3. How the Test Operates

Under the minimum load condition of the DUT, through closed-loop monitoring (using an oscilloscope to measure the ripple voltage Upp and current Ipp at the DUT terminal in real time), gradually increase the ripple voltage UR at the power supply terminal (frequency step is 2% logarithmic step, dwell time ≥2 seconds per frequency point), until the DUT terminal reaches the target ripple voltage Upp or the maximum current limit Ipp. The purpose of this step is to record the correspondence between the "power supply terminal UR value" and the "DUT terminal Upp value" at each frequency point (factors such as equivalent internal resistance may cause UR > Upp, e.g., UR = Upp + Ipp × Ri).

Based on the "UR-Upp" template generated by the reference test, directly use the power supply terminal's UR value for injection (without further adjusting UR), ensuring the Upp at the DUT terminal meets the standard requirements.

4. Why It Can Avoid Power Supply Internal Resistance Impact?

Equivalent internal resistance (Ri) is an inherent characteristic of the vehicle power supply system (such as battery internal resistance, cable resistance), causing a difference (ΔU = Ipp × Ri) between the "UR value output by the power supply terminal" and the "Upp value actually received by the DUT terminal." Traditional open-loop testing, unable to monitor the DUT terminal voltage, can only compensate for the internal resistance impact by "increasing the power supply terminal UR value," easily leading to "over-injection" (Upp exceeding standard limits) and damaging the DUT.

The reference test (pre-scan UR value) establishes the correspondence between the "power supply terminal UR value" and the "DUT terminal Upp value" through real-time monitoring of the DUT terminal voltage, ensuring the injected UR value can meet the Upp requirement at the DUT terminal. This "closed-loop control" method uses the same power supply setting value for the injection test as the reference test, meaning the UR value is considered the same, ensuring the required ripple level (e.g., 6Vpp) has been achieved.

5. Test System

Standard Support

  • ISO 16750-2:2023
  • VW 80000:2021
  • MBN LV124-1 2013
  • ISO 21780:2020
  • GB/T 45120-2024
  • MBN LV148 2013
  • ......

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High Integration Design

High Integration Design

Integrated Hardware and Software

Integrated Hardware and Software

Multi-Standard Compatibility

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Easy to Expand

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Test System

PTS Series Power System

6. Test Software

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Core Functions

  • Closed-Loop Dynamic Testing

    Closed-Loop Dynamic Testing

    Integrates real-time monitoring and dynamic feedback mechanisms

  • High/Low Voltage Superimposed Ripple Test

    High/Low Voltage Superimposed Ripple Test

    Complies with standard verification requirements (including ripple Upp, Ipp monitoring)

  • Power Supply and Amplifier Architecture

    Power Supply and Amplifier Architecture

    Compatible with bipolar power supply and amplifier architecture solutions

VectWorks Test Report
VectWorks Test Report

7. Summary

1. Evolution of Test Methods

Upgraded from traditional "open-loop injection" (e.g., ISO 16750-2:2012) to "closed-loop control" (e.g., ISO 16750-2:2023), ensuring the actual voltage at the DUT terminal meets standards through "Reference Test (Pre-scan UR value)", avoiding the impact of power supply internal resistance, and improving test accuracy and reliability.

2. Expansion of Frequency Coverage

With the popularization of new energy vehicles, the test frequency range has been extended from the traditional below 30kHz to 200kHz, covering the high-frequency switching ripple of equipment such as DC/DC converters and OBC, ensuring the reliability of electronic equipment in the new energy vehicle environment.

3. Optimization of Limit Division

Adopts segmented limits. The low-frequency band (10Hz-30kHz) mainly simulates low-frequency ripple from traditional generators or DC/DC converters; The high-frequency band (30kHz~200kHz) mainly simulates high-frequency switching ripple from new energy vehicle equipment, with stricter limits to avoid interference with high-frequency communication equipment.

4. Enhancement of Test Rigor

Added reference test (pre-scan UR value) to ensure the actual voltage at the DUT terminal meets standards; Measure DUT impedance before and after the test to ensure the DUT is not damaged during testing; Clear functional status requirements ensure the reliability of test results.

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