Test Systems
GtestWorks Automated Testing Platform
VectWorks 3.0 Electrical Performance Test Software
When selecting a data acquisition platform for your electronic or electromechanical applications, numerous factors must be balanced. High-speed digitizers lack features such as isolation, attenuation, or bit precision required for power electronics testing. While PC-based platforms offer high data throughput, they do so at the expense of noise immunity, signal conditioning, and hardware integrity.
To date, only the new YOKOGAWA SL1000 data acquisition system achieves a sampling speed of 100 MS/ch with channel isolation, while maintaining uncompromised bit precision, storage length, and data transmission performance.
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All channels have an acquisition speed of up to 100MS/s (10ns sampling period)
Data can be saved to a PC via high-speed USB 2.0 or 1000BASE-T Gigabit Ethernet² communication
Fast and intuitive operation allows you to start measuring immediately
Store data directly to the SL1000
12 different plug-in modules are available for selection
Link up to 8 units and enable synchronized measurement with up to 128 channels
| Description | Sampling Rate | Resolution | Bandwidth | Number of Channels | Isolation | Maximum Input Voltage (DC+ACpeak) | DC Accuracy | Notes |
|---|---|---|---|---|---|---|---|---|
| High-Speed 100MS/s 12-Bit Isolated Module | 100MS/s | 12-Bit | 20MHz | 2 | Isolated | 1000V7, 200V2 | ±0.5% | High-speed, High-voltage, Isolated |
| High-Speed 10MS/s 12-Bit Isolated Module | 10MS/s | 12-Bit | 3MHz | 2 | Isolated | 800V7, 200V2 | ±0.5% | High Noise Immunity |
| High-Speed 1MS/s 16-Bit Isolated Module | 1MS/s | 16-Bit | 300kHz | 2 | Isolated | 600V7, 140V2 | ±0.25% | High Sensitivity Range (1mV/div), Low Noise (±100μVyp), High Noise Immunity |
| High-Speed 10MS/s 12-Bit Non-Isolated Module | 10MS/s | 12-Bit | 3MHz | 2 | Non-Isolated | 600V7, 200V2 | ±0.5% | High-speed, Non-isolated |
| High-Voltage 100MS/s 16-Bit Isolated Module (with AAF, RMS) | 1MS/s | 16-Bit | 300kHz | 2 | Isolated | 850V73 | ±0.25% | With AAF, RMS, High Noise Immunity |
| Universal Module | 100MS/s (Voltage), 500S/s (Temperature) | 16-Bit (Voltage), 0.1℃ (Temperature) | 40kHz (Voltage), 100Hz (Temperature) | 2 | Isolated | 42V | ±0.25% (Voltage) | Thermocouple (Types K, E, J, T, L, U, N, R, S, B, W, Fe-Cr-Ni) |
| Universal Module (with AAF) | 100MS/s (Voltage), 500S/s (Temperature) | 16-Bit (Voltage), 0.1℃ (Temperature) | 40kHz (Voltage), 100Hz (Temperature) | 2 | Isolated | 42V | ±0.25% (Voltage) | Thermocouple (Types K, E, J, T, L, U, N, R, S, B, W, Fe-Cr-Ni), with AAF |
| Temperature/High-Precision Voltage Module | 500S/s (Voltage), 500S/s (Temperature) | 16-Bit (Voltage), 0.1℃ (Temperature) | 100Hz | 2 | Isolated | 42V | ±0.08% (Voltage) | Thermocouple (Types K, E, J, T, L, U, N, R, S, B, W, Fe-Cr-Ni), High Sensitivity Range (1mV) |
| Temperature/High-Precision Voltage Module | 125S/s | 16-Bit (Voltage), 0.1℃ (Temperature) | 15Hz | 2 | Isolated | 42V | ±0.08% (Voltage) | Thermocouple (Types K, E, J, T, L, U, N, R, S, B, W, Fe-Cr-Ni), High Sensitivity Range (1mV), Low Noise |
| Acceleration/Voltage Module (with AAF) | 100kS/s | 16-Bit | 40kHz | 2 | Isolated | 42V | ±0.25% (Voltage) | Built-in Anti-Aliasing Filter (AAF), Supports Built-in Amplifier-type Accelerometer (4mA/22V) |
| Strain Module (NDIS) | 100kS/s | 16-Bit | 20kHz | 2 | Isolated | 10V | ±0.5% (Strain) | Supports Strain NDIS, 2/5/10V Internal Bridge Power Supply |
| Strain Module (DSUB, Shunt Calibration) | 100kS/s | 16-Bit | 20kHz | 2 | Isolated | 10V | ±0.5% (Strain) | Supports Strain DSUB, 2/5/10V Internal Bridge Power Supply, Shunt Calibration |
| Frequency Module | 1MS/s | 16-Bit | Minimum Measurement Precision 625ps | 2 | Isolated | 420V7, 42V2 | ±0.1% (Frequency) | Measurement Frequency Range: 0.01Hz~500kHz; Measured Parameters (Frequency, Rotational Speed, Period, Duty Cycle, Mains Frequency, Pulse Width, Pulse Integration, Speed) |
Version: 202504
Version: 202504
Version: 202504
Version: 202504
